| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1631085 | Materials Today: Proceedings | 2015 | 6 Pages |
Abstract
Three samples of dilute magnetic semiconductors (DMS) have been prepared by solid state reaction method at sintering temperature of 950 °C for 5 hours. Their structural, optical, electrical and magnetic properties are optimized by X-Ray Difractometer (XRD), UV-Visible spectrophotometer (UV-Vis), Four point probe method and Vibrating sample magnetometer (VSM) measurements respectively. Surface morphology has been studied by using scanning electron microscope (SEM). Structural analysis showed that a single phase Rutile structure has been attained while Optical and resistivity measurements confirmed their semiconducting behaviors. Magnetic measurements showed weak Ferromagnetic and Paramagnetic behaviors at room temperature.
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