| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1672849 | Thin Solid Films | 2009 | 7 Pages |
Abstract
A simple method is depicted in this communication to determine the optical constants of transparent thin films from transmittance versus wavelength traces, showing no fringes, for evaluating thickness. The strength of this technique is apparent when applied to Zn1 − xMgxO films.
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Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
S.R. Bhattacharyya, R.N. Gayen, R. Paul, A.K. Pal,