Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1679066 | Ultramicroscopy | 2008 | 7 Pages |
Abstract
A new method for the dynamical simulation of convergent beam electron diffraction (CBED) patterns is proposed. In this method, the three-dimensional stationary Schrödinger equation is replaced by a two-dimensional time-dependent equation, in which the direction of propagation of the electron beam, variable z, stands as a time. We demonstrate that this approach is particularly well-suited for the calculation of the diffracted intensities in the case of a z-dependent crystal potential. The corresponding software has been developed and implemented for simulating CBED patterns of various specimens, from perfect crystals to heavily strained cross-sectional specimens. Evidence is given for the remarkable agreement between simulated and experimental patterns.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
F. Houdellier, A. Altibelli, C. Roucau, M.J. Casanove,