Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1786141 | Current Applied Physics | 2013 | 8 Pages |
Abstract
⺠nc-Si:H films were grown by RF PECVD at substrate temperatures of 80-200 °C. ⺠Films grown away from the gas inlet are nanocrystalline at all temperatures. ⺠160 °C was the optimal substrate temperature for the growth of nc-Si:H film.
Keywords
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Condensed Matter Physics
Authors
Tamila Anutgan, Sema Uysal,