| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1786531 | Current Applied Physics | 2012 | 6 Pages |
The microwave dielectric properties of La1-xBx(Mg0.5Sn0.5)O3 ceramics were examined with a view to their exploitation for mobile communication. The La1-xBx(Mg0.5Sn0.5)O3 ceramics were prepared by the conventional solid-state method with various sintering temperatures. The X-ray diffraction patterns of the La0.995B0.005(Mg0.5Sn0.5)O3 ceramics revealed no significant variation of phase with sintering temperatures. A maximum apparent density of 6.58 g/cm3, a dielectric constant (εr) of 19.8, a quality factor (Q × f) of 41,800 GHz, and a temperature coefficient of resonant frequency (τf) of −86 ppm/°C were obtained for La0.995B0.005(Mg0.5Sn0.5)O3 ceramics that were sintered at 1500 °C for 4 h.
► La0.995B0.005(Mg0.5Sn0.5)O3 ceramic had an apparent density of 6.58 g/cm3 ► La0.995B0.005(Mg0.5Sn0.5)O3 ceramic had a dielectric constant of 19.8. ► La0.995B0.005(Mg0.5Sn0.5)O3 ceramic had a Q ×× f of 41,800 GHz ► La0.995B0.005(Mg0.5Sn0.5)O3 ceramic had a τfτf of −86 ppm/°C.
