| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1787093 | Current Applied Physics | 2012 | 4 Pages |
Abstract
⺠We fabricated high aspect ratio SiGe quantum dot probe. ⺠Local interaction imaging of cleaved InAs surface was demonstrated by FM nc-AFM. ⺠The local contrast image is attributed to no contact potential difference. ⺠Low frequency-change of the probe contributes to the local contrast image.
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Condensed Matter Physics
Authors
Yonkil Jeong, Masato Hirade, Ryohei Kokawa, Hirofumi Yamada, Kei Kobayashi, Noriaki Oyabu, Toyoko Arai, Akira Sasahara, Masahiko Tomitori,