Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1788230 | Current Applied Physics | 2009 | 6 Pages |
Abstract
Zn1âxMnxO thin films have been synthesized by chemical spray pyrolysis at different substrate temperatures in the range, 250-450 °C for a manganese composition, x = 15%, on corning 7059 glass substrates. The as-grown layers were characterized to evaluate their chemical and physical behaviour with substrate temperature. The change of dopant level in ZnO films with substrate temperature was analysed using X-ray photoelectron spectroscope measurements. The X-ray diffraction studies revealed that all the films were strongly oriented along the (0 0 2) orientation that correspond to the hexagonal wurtzite structure. The crystalline quality of the layers increased with the increase of substrate temperature up to 400 °C and decreased thereafter. The crystallite size of the films varied in the range, 14-24 nm. The surface morphological studies were carried out using atomic force microscope and the layers showed a lower surface roughness of 4.1 nm. The optical band gap of the films was â¼3.35 eV and the electrical resistivity was found to be high, â¼104 Ω cm. The films deposited at higher temperatures (>350 °C) showed ferromagnetic behaviour at 10 K.
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Condensed Matter Physics
Authors
L. Raja Mohan Reddy, P. Prathap, K.T. Ramakrishna Reddy,