Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1788649 | Current Applied Physics | 2010 | 5 Pages |
Abstract
Mo-doped In2O3 thin films have been prepared on glass substrates using an activated reactive evaporation method and systematically studied the effect of oxygen partial pressure on the structural, optical, electrical and photoluminescence properties of the films. The obtained films are highly transparent and conductive. The films exhibited the lowest electrical resistivity of 5.2 Ã 10â4 Ω cm, with an average optical transmittance of 90% in the visible region. An intensive photoluminescence emission peaks were observed at 415 and 440 nm.
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Authors
S. Kaleemulla, A. Sivasankar Reddy, S. Uthanna, P. Sreedhara Reddy,