| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 179956 | Electrochemistry Communications | 2012 | 4 Pages |
Abstract
The implementation of non-optical shearforce detection for electrode positioning in SECM-based automate is described. This automate was applied to the visualization of reactive defects in a large and complex metal sample. This new setup allows measuring profile in the mm range while keeping high resolution for both electrochemical measurement and profile determination.
► Shearforce detection for SECM-based Automate. ► Application to scanning large and complex samples. ► Simultaneous profile and electrochemical measurements. ► The sample profile can be in the mm range and the resolution of the analysis can be in the μm range.
Related Topics
Physical Sciences and Engineering
Chemical Engineering
Chemical Engineering (General)
Authors
Mathieu Etienne, Bassim Layoussifi, Thierry Giornelli, Denis Jacquet,