Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1807394 | Magnetic Resonance Imaging | 2008 | 11 Pages |
Abstract
A method for the incorporation of empirical measurements into a bias-correction map, which would be useful for characterizing uncertainty and for reducing systematic bias in DTI data, is introduced.
Keywords
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Condensed Matter Physics
Authors
Nathan E. Yanasak, Jerry D. Allison, Tom C.-C. Hu,