Article ID Journal Published Year Pages File Type
181607 Electrochemistry Communications 2008 4 Pages PDF
Abstract

In this work we successfully prepared p-type semiconducting Cu2−xTe layers on Cu substrates by applying a potential multistep signal. Spontaneously deposited tellurium layers were reduced in a single cathodic sweep. The X-ray diffraction characterization showed the presence of single-phased, crystalline Cu2−xTe in the weissite form. A further anodization step allows crystallization of several phases such as Cu1.75Te, Cu0.664Te0.336 and Cu7Te4. This type of sample was found to be photoactive. The prepared films are p-type and have carrier concentrations in the order of 1021 cm−3, suitable for CdTe-Cu2−xTe contacts.

Related Topics
Physical Sciences and Engineering Chemical Engineering Chemical Engineering (General)
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