Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1824725 | Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment | 2011 | 4 Pages |
We have developed an energy-resolved X-ray imaging method using the counting-type pixel detector PILATUS-100K. X-ray intensities were recorded as a scan of threshold energies, and the X-ray energy was determined by an s-curve fitting analysis. As a capability study of ultra precise energy-resolved imaging, X-ray beam intensities at 15.75, 15.76, 15.77, 15.78, 15.79, and 15.80 keV were measured and their threshold scan distributions could be clearly separated from each other. Laue diffraction patterns of a silicon steel sample were recorded with white X-ray beams. A grain image of silicon steel was obtained with a sample position scan. The reflected X-ray energy was also measured at three sample positions to analyze the lattice constant of the sample crystal grain.