| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1850102 | Nuclear Science and Techniques | 2006 | 12 Pages |
Abstract
Synchrotron radiation X-ray scattering is a useful tool for structural characterization of liquid interfaces. Specular reflectivity provides precise measurement of the interfacial widths and of the ordering of surfactants adsorbed to these interfaces. Diffuse scattering gives information on phase transitions and domain formation in surfactant monolayers and on interfacial fluctuations confined by and coupled across fluidic films.
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Nuclear and High Energy Physics
Authors
LI Ming, Mark L. SCHLOSSMAN,