| Article ID | Journal | Published Year | Pages | File Type | 
|---|---|---|---|---|
| 1883136 | Radiation Physics and Chemistry | 2009 | 8 Pages | 
Abstract
												We review an atomic resolution imaging method based on the analysis of the fine structure in X-ray absorption anisotropy, which results from incident beam diffraction. For a polychromatic X-ray beam, due to the suppression of higher order diffraction fringes, X-ray absorption anisotropy patterns can be interpreted as distorted real-space projections of the atomic structure around absorbing atoms. A qualitative method for analysis of X-ray absorption anisotropy patterns is presented, based on modeling of X-ray patterns with ray-traced images calculated for clusters around absorbing atoms.
											Related Topics
												
													Physical Sciences and Engineering
													Physics and Astronomy
													Radiation
												
											Authors
												P. Korecki, M. Tolkiehn, D.V. Novikov, 
											