Article ID Journal Published Year Pages File Type
1883136 Radiation Physics and Chemistry 2009 8 Pages PDF
Abstract
We review an atomic resolution imaging method based on the analysis of the fine structure in X-ray absorption anisotropy, which results from incident beam diffraction. For a polychromatic X-ray beam, due to the suppression of higher order diffraction fringes, X-ray absorption anisotropy patterns can be interpreted as distorted real-space projections of the atomic structure around absorbing atoms. A qualitative method for analysis of X-ray absorption anisotropy patterns is presented, based on modeling of X-ray patterns with ray-traced images calculated for clusters around absorbing atoms.
Related Topics
Physical Sciences and Engineering Physics and Astronomy Radiation
Authors
, , ,