Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1883136 | Radiation Physics and Chemistry | 2009 | 8 Pages |
Abstract
We review an atomic resolution imaging method based on the analysis of the fine structure in X-ray absorption anisotropy, which results from incident beam diffraction. For a polychromatic X-ray beam, due to the suppression of higher order diffraction fringes, X-ray absorption anisotropy patterns can be interpreted as distorted real-space projections of the atomic structure around absorbing atoms. A qualitative method for analysis of X-ray absorption anisotropy patterns is presented, based on modeling of X-ray patterns with ray-traced images calculated for clusters around absorbing atoms.
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Radiation
Authors
P. Korecki, M. Tolkiehn, D.V. Novikov,