Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1883155 | Radiation Physics and Chemistry | 2009 | 5 Pages |
Abstract
This paper reports on the results of detailed X-ray diffraction studies of ZnTe and ZnMgTe nanowires grown by molecular beam epitaxy. As the aim of proper interpretation of the X-ray measurements of samples consisting of large number of nanowires we defined a virtual unit cell as an averaged one from all really existing cells in the large number of nanowires. The studies revealed that average structure of nanowires is characterized by a minor rhombohedral distortion. The occurrence of this distortion is attributed to the specific defect structure in the majority of nanowires.
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Radiation
Authors
E. Dynowska, W. Szuszkiewicz, J.Z. Domagala, E. Janik, A. Presz, T. Wojtowicz, G. Karczewski, W. Caliebe,