Theoretical and experimental study of resonant inelastic X-ray scattering for NiO

Resonant inelastic X-ray scattering (RIXS) spectra for Ni 2p2p to 3d3d excitation and 3d3d to 2p2p de-excitation of NiO are studied both theoretically and experimentally. Theoretical calculations with a single impurity Anderson model (SIAM) describe the charge transfer (CT) and dd–dd excitations in RIXS, and detailed study is made for the CT energy. High resolution RIXS measurements reveal the precise dd–dd excitation structure and its polarization dependence, and they are well reproduced by the SIAM calculation.