An increase of utilization efficiency of X-ray beam

The features of absorbed dose field formation in objects irradiated with scanned X-ray beams at double-and four-sided irradiation were investigated both analytically and by Monte Carlo methods. An analytical approach uses an angular/spectrum X-ray characteristics calculated with PENELOPE, JEANT 4 and ModeXR codes. It was shown that the special angular orientation of electron beam incidence on the X-ray converter leads to X-ray dose smoothing on the surface of the irradiated object. At the same time, a double-sided irradiation can provide high X-ray beam efficiency at dose uniformity ration (DUR) <1.5 for sizeable object thickness. At four-sided irradiation, the angular orientation of electron beam incidence on the X-ray converter should be changed so as to focus the electrons to the center of the converter. At this mode X-ray beam efficiency is more than 60%.