| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1884802 | Radiation Physics and Chemistry | 2007 | 8 Pages |
Abstract
Positron annihilation spectroscopy has been used to measure the ortho-positronium lifetime variation with respect to the temperature in an 80-nm polystyrene film on Si in different depths. The surface and interface glass transition temperatures were found to be significantly suppressed by 18 and 12Â K at the depth of 5 and 70Â nm from the surface, respectively. The observed Tg-depth dependence is interpreted as a different degree of free-volume distributions at the surface and the interface with Si.
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Radiation
Authors
Junjie Zhang, Hongmin Chen, Ying Li, R. Suzuki, T. Ohdaira, Y.C. Jean,