Article ID Journal Published Year Pages File Type
1884812 Radiation Physics and Chemistry 2007 4 Pages PDF
Abstract
Defect structure of hydrogenated amorphous silicon thin-films was studied by positron annihilation spectroscopy (PAS), whereas the density of states below the Fermi level was measured by constant photocurrent method (CPM). Divacancies and large vacancy clusters were identified as the main defects present in these films, with relative concentrations strongly dependent on the rf-power. Correlation between PAS, CPM results and I(V) characteristics of solar cells suggests the creation of energy levels above the Fermi energy, not observable by CPM, related to large vacancy clusters.
Related Topics
Physical Sciences and Engineering Physics and Astronomy Radiation
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