| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1886532 | Radiation Physics and Chemistry | 2012 | 6 Pages |
Abstract
The low dose limit and the accuracy of high sensitivity MOS ionizing radiation dosimeters fabricated at LAAS-CNRS are investigated.
► Low dose limit of thick-oxide Metal-Oxide-Semiconductor dosimeters is investigated. ► Influence of read-time instability, electronic noise, temperature variation and calibration is considered. ► It is concluded that such sensors can operate in the mGy range with acceptable accuracy.
Keywords
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Radiation
Authors
G. Sarrabayrouse, S. Siskos,