Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
2503254 | International Journal of Pharmaceutics | 2011 | 9 Pages |
Abstract
We review the application of time-of-flight secondary-ion mass spectrometry (ToF-SIMS) for the surface chemical identification and distribution analysis (mapping) of pharmaceutically relevant materials. Specifically we explore the characterization of both solid state pharmaceuticals and bio-pharmaceuticals by ToF-SIMS; highlighting specific case studies concerning the distribution and stability of pharmaceutical actives within solid matrices, the face-specific properties of pharmaceutical crystals and elucidation of the structure/conformation of adsorbed proteins. Finally, potential future applications of ToF-SIMS in pharmaceutics are detailed.
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Authors
Timothy J. Barnes, Ivan M. Kempson, Clive A. Prestidge,