| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 386372 | Expert Systems with Applications | 2011 | 6 Pages |
Abstract
In this study, we propose cause selecting control charts to monitor two dependent process stages with attributes data. The control limits on the bivariate binomial control region can be obtained. The detection ability of the cause selecting control charts is compared to those of Shewhart attributes control charts and the bivariate binomial control region by different correlation. Numerical example and simulation study show that the cause selecting control charts perform better than Shewhart attributes control charts and the bivariate binomial control region.
Keywords
Related Topics
Physical Sciences and Engineering
Computer Science
Artificial Intelligence
Authors
Su-Fen Yang, Jin-Tyan Yeh,