| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 416871 | Computational Statistics & Data Analysis | 2006 | 23 Pages |
Abstract
Tests based on the empirical distribution function are given for the goodness-of-fit of the three-parameter lognormal distribution when all three parameters are unknown. Critical values for finite samples are approximated by simple polynomial functions of the sample size and the shape parameter. Asymptotic critical values are computed to check these functions.
Related Topics
Physical Sciences and Engineering
Computer Science
Computational Theory and Mathematics
Authors
Colin Chen,