Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
417282 | Computational Statistics & Data Analysis | 2008 | 24 Pages |
Abstract
The finite sample properties of the Fourier estimator of integrated volatility under market microstructure noise are studied. Analytic expressions for the bias and the mean squared error (MSE) of the contaminated estimator are derived. These formulae can be practically used to design optimal MSE-based estimators, which are very robust and efficient in the presence of noise. Moreover an empirical analysis based on a simulation study and on high-frequency logarithmic prices of the Italian stock index futures (FIB30) validates the theoretical results.
Keywords
Related Topics
Physical Sciences and Engineering
Computer Science
Computational Theory and Mathematics
Authors
M.E. Mancino, S. Sanfelici,