Article ID Journal Published Year Pages File Type
442537 Computers & Graphics 2015 10 Pages PDF
Abstract

•An optimized L2,1L2,1 metric is used for VSA method.•A novel patch-aware similarity metric is proposed.•We improve SDF calculation by using anisotropic smoothing.•The patch and part aware similarities are adaptively combined into a uniform metric.•A hierarchy of segmentations are obtained with our hierarchical splat clustering.

This paper presents a novel hierarchical shape segmentation method based on splats for 3D shapes. The major contribution is to propose a new similarity metric based on splats, which combines patch-aware similarity and part-aware similarity adaptively. An optimized L2,1L2,1 metric for VSA (variational shape approximation) method is used to get splats first, and such adaptive similarity metric is used to generate a hierarchy of components automatically through adaptive cluster. As a result, a binary tree is used to represent the hierarchy, in which low level segments are patch-aware regions while high level segments are part-aware components. Therefore, the combination and decomposition relations are clear between segments. Our method is designed to handle arbitrary models, such as CAD model, scanned object, organic shape, large-scale mesh and noisy model. A large number of experiments demonstrate the efficiency of our algorithm.

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Related Topics
Physical Sciences and Engineering Computer Science Computer Graphics and Computer-Aided Design
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