Experimental verification of a linear inverse scattering algorithm for the localization of planar interfaces

The problem of the localization and the determination of the extent of a void layer embedded in a masonry structure starting from the knowledge of the scattered field is addressed. The problem is recast as the subsequent localization of single interfaces by using an inverse scattering approach in frequency domain. Each interface is searched by assuming the dielectric properties of the wall known and inverting an appropriate linear model. Experimental validation of the approach is performed by means of scattered field measurements collected at different frequencies in controlled conditions for a tuff masonry illuminated by a bow-tie antenna.