| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 447549 | AEU - International Journal of Electronics and Communications | 2006 | 4 Pages |
Abstract
Determination of the complex permittivity of materials via transmission/reflection measurement in rectangular waveguides is formulated as an inverse scattering problem. The presented approach is directly applicable to measurements performed with various sample sizes and orientations. The predicted results are compared with measurements and good agreement is obtained.
Related Topics
Physical Sciences and Engineering
Computer Science
Computer Networks and Communications
Authors
Serkan Şimşek, Cevdet Işık, Ercan Topuz, Bayram Esen,