Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
4954122 | AEU - International Journal of Electronics and Communications | 2017 | 6 Pages |
Abstract
We show that the pinched hysteresis behavior observed in a voltage-controlled resistor with state-feedback self-control can be attributed to the current flowing in the parasitic capacitance holding the voltage across this resistor. A mathematical model describing this circuit structure is derived and validated numerically. To provide experimental evidence of this proposal, a circuit representing a voltage-controlled resistor is placed in parallel with a capacitor and then the current in this capacitor, which is proportional to the derivative of the applied voltage, is sensed, converted into a voltage and used to control the resistance value. This leads to the appearance of a pinched hysteresis loop as theoretically predicted. This work provides further insight into the origin of this behavior in fabricated solid-state devices that can be shown to follow the proposed circuit structure.
Related Topics
Physical Sciences and Engineering
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Authors
A.S. Elwakil, B.J. Maundy, C. Psychalinos,