Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
4970019 | Pattern Recognition Letters | 2017 | 9 Pages |
Abstract
We present a convolutional approach to reflection symmetry detection in 2D. Our model, built on the products of complex-valued wavelet convolutions, simplifies previous edge-based pairwise methods. Being parameter-centered, as opposed to feature-centered, it has certain computational advantages when the object sizes are known a priori, as demonstrated in an ellipse detection application. The method outperforms the best-performing algorithm on the CVPR 2013 Symmetry Detection Competition Database in the single-symmetry case. We release code and a new, larger image database.
Related Topics
Physical Sciences and Engineering
Computer Science
Computer Vision and Pattern Recognition
Authors
Marcelo Cicconet, Vighnesh Birodkar, Mads Lund, Michael Werman, Davi Geiger,