Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
499083 | Computer Methods in Applied Mechanics and Engineering | 2009 | 15 Pages |
Abstract
Dislocation models based on the extended finite element method (XFEM) are developed for thin shells such as carbon nanotubes (CNTs) and thin films. In shells, methods for edge dislocations, which move by glide, and prismatic dislocations, which move by climb, are described. In thin films, methods for dislocations with edge, screw and/or prismatic character are developed in three dimensions. Singular enrichments are proposed which allow the Peach–Koehler force to be computed directly from the stress field along the dislocation line and give improved accuracy.
Related Topics
Physical Sciences and Engineering
Computer Science
Computer Science Applications
Authors
Jay Oswald, Robert Gracie, Roopam Khare, Ted Belytschko,