| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5006579 | Measurement | 2017 | 4 Pages |
Abstract
Box counting is a simple method to calculate the fractal dimension of an image, but it is poorly understood for estimating phase fraction from the microstructure image. Here, we investigate six recipes to estimate the phase fraction by box counting method (BCM). The optimal recipe is determined by applications in the microstructures of Ni-B alloys, and is further verified by theoretical analysis. As compared to pre-existing methods, BCM is more convenient and can provide accurate phase fraction by lower cost.
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Control and Systems Engineering
Authors
Junfeng Xu, Zengyun Jian, Xin Lian,