Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5007461 | Optics & Laser Technology | 2017 | 6 Pages |
Abstract
In this work, we address the phase ambiguity in white light spectral interferometry. This ambiguity prevents one from obtaining the refractive index over a broad spectral range with high accuracy. We first determine the error when the refractive index is fitted to a linear combination of power functions. We demonstrate that the error is proportional to wavelength and independent of sample thickness. We show how to reduce the error over the entire spectral band by measuring the spectral phase at the output of the interferometer for some suitable wavelengths as a function of sample orientation.
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Authors
Yago Arosa, Elena López Lago, Raúl de la Fuente,