An alternative objective microscopic method for the identification of linear enamel hypoplasia (LEH) in the absence of visible perikymata

- A new quantitative microscopic method for the identification of LEH is proposed.
- The method relies on enamel surface depth profiles to objectively identify defects.
- It is suitable when there is an absence of visible/continuous perikymata.
- Results compare favorably with existing microscopic and macroscopic methods.
- The method is designed to deal with worn archaeological dental assemblages.