Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
531514 | Pattern Recognition | 2008 | 11 Pages |
Abstract
In this paper, we learn a distance metric in favor of classification task from available labeled samples. Multi-class data points are supposed to be pulled or pushed by discriminant neighbors. We define a discriminant adjacent matrix in favor of classification task and learn a map transforming input data into a new space such that intra-class neighbors become even more nearby while extra-class neighbors become as far away from each other as possible. Our method is non-parametric, non-iterative, and immune to small sample size (SSS) problem. Target dimensionality of the new space is selected by spectral analysis in the proposed method. Experiments on real-world data sets demonstrate the effectiveness of our method.
Related Topics
Physical Sciences and Engineering
Computer Science
Computer Vision and Pattern Recognition
Authors
Wei Zhang, Xiangyang Xue, Zichen Sun, Hong Lu, Yue-Fei Guo,