Article ID Journal Published Year Pages File Type
533814 Pattern Recognition 2006 9 Pages PDF
Abstract

A prototype reduction algorithm is proposed, which simultaneously trains both a reduced set of prototypes and a suitable local metric for these prototypes. Starting with an initial selection of a small number of prototypes, it iteratively adjusts both the position (features) of these prototypes and the corresponding local-metric weights. The resulting prototypes/metric combination minimizes a suitable estimation of the classification error probability. Good performance of this algorithm is assessed through experiments with a number of benchmark data sets and with a real task consisting in the verification of images of human faces.

Related Topics
Physical Sciences and Engineering Computer Science Computer Vision and Pattern Recognition
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