Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
533814 | Pattern Recognition | 2006 | 9 Pages |
Abstract
A prototype reduction algorithm is proposed, which simultaneously trains both a reduced set of prototypes and a suitable local metric for these prototypes. Starting with an initial selection of a small number of prototypes, it iteratively adjusts both the position (features) of these prototypes and the corresponding local-metric weights. The resulting prototypes/metric combination minimizes a suitable estimation of the classification error probability. Good performance of this algorithm is assessed through experiments with a number of benchmark data sets and with a real task consisting in the verification of images of human faces.
Keywords
Related Topics
Physical Sciences and Engineering
Computer Science
Computer Vision and Pattern Recognition
Authors
Roberto Paredes, Enrique Vidal,