Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
535226 | Pattern Recognition Letters | 2009 | 5 Pages |
Abstract
Many pattern recognition and machine learning approaches employ a distance metric on patterns, or a generality relation to partially order the patterns. We investigate the relationship amongst them and prove a theorem that shows how a distance metric can be derived from a partial order (and a corresponding size on patterns) under mild conditions. We then discuss the use of the theorem. More specifically, we show how well-known distance metrics for sets, strings, trees and graphs can be derived from their generality relation.
Keywords
Related Topics
Physical Sciences and Engineering
Computer Science
Computer Vision and Pattern Recognition
Authors
Luc De Raedt, Jan Ramon,