Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
535534 | Pattern Recognition Letters | 2005 | 11 Pages |
Abstract
This article considers the problem of binary classification and its assessment in a distribution-free approach. We estimate the area under the ROC curve (a more general performance metric than the error rate) of a classifier using a bootstrap-based estimator. We then use the method of the influence function to estimate the uncertainty of that estimate from the very same bootstrap samples. Monte Carlo trials show that small-sample estimates can be obtained with little bias.
Keywords
Related Topics
Physical Sciences and Engineering
Computer Science
Computer Vision and Pattern Recognition
Authors
Waleed A. Yousef, Robert F. Wagner, Murray H. Loew,