Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
535916 | Pattern Recognition Letters | 2011 | 7 Pages |
This paper presents a novel robust image alignment technique that performs joint geometric and photometric registration in the total least square (TLS) sense. Therefore, we employ the total least square metric instead of the ordinary least square (OLS) metric, which is commonly used in the literature. While the OLS model is sufficient to tackle geometric registration problems, it gives no mutually consistent estimates when dealing with photometric deformations. By introducing a new TLS model, we obtain mutually consistent parameters. Experimental results show that our method is indeed more consistent and accurate in presence of noise compared to existing joint registration algorithms.
► Use of the total least square metric allows for perturbations in the reference image. ► Proposed method is more accurate and consistent in presence of noise. ► Method is not limited to linear models and requires less memory than the basic TLS approach.