| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 537930 | Displays | 2010 | 5 Pages |
Abstract
The two-dimensional refractive index distribution of a flexible indium tin oxide film deposited on a PET layer is measured before/after the bend-testing with an alternative technique based on Fresnel equations and the heterodyne interferometry. Their standard deviations are derived and they vary more obviously than the resistance variations measured in the conventional method. Hence the standard deviation of the refractive index can be used as the indicator to justify the durability of a flexible indium tin oxide film. The validity is demonstrated.
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Authors
Yen-Liang Chen, Hung-Chih Hsieh, Wang-Tsung Wu, Bor-Jiunn Wen, Wei-Yao Chang, Der-Chin Su,