Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5449138 | Optics Communications | 2017 | 9 Pages |
Abstract
Phase-shifting (PS) is a well-known technique for phase retrieval in interferometry, with applications in deflectometry and 3D-profiling, which requires a series of intensity measurements with certain phase-steps. Usually the phase-steps are evenly spaced, and its knowledge is crucial for the phase retrieval. In this work we present a method to extract the phase-step between consecutive interferograms. We test the proposed technique with images corrupted by additive noise. The results were compared with other known methods. We also present experimental results showing the performance of the method when spatial filters are applied to the interferograms and the effect that they have on their relative phase-steps.
Related Topics
Physical Sciences and Engineering
Materials Science
Electronic, Optical and Magnetic Materials
Authors
Gastón A. Ayubi, Ignacio Duarte, César D. Perciante, Jorge L. Flores, José A. Ferrari,