| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5454179 | Journal of Nuclear Materials | 2017 | 27 Pages |
Abstract
U-Mo alloys irradiated with 84Â MeV Xe ions to various doses were characterized with transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM) techniques. The TEM thin foils were prepared perpendicular to the irradiated surface to allow a direct observation of the entire region modified by ions. Therefore, depth-selective microstructural information was revealed. Varied irradiation-induced phenomena such as gas bubble formation, phase reversal, and recrystallization were observed at different ion penetration depths in U-Mo.
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Authors
B. Ye, L. Jamison, Y. Miao, S. Bhattacharya, G.L. Hofman, A.M. Yacout,