| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5466249 | Thin Solid Films | 2017 | 34 Pages |
Abstract
This paper presents a study of optical and microstructural properties of the TiO2/316L, TiO2/Ti/316L and TiO2/Ti/glass interference systems obtained by gas injection magnetron sputtering technique (GIMS) employing a commercial magnetron line. The samples are examined by means of spectrophotometry, spectroscopic ellipsometry, confocal optical microscopy, X-ray photoelectron spectroscopy and atomic force microscopy. The investigation is completed by colorimetric analysis. Our analysis shows the significant differences in the color of samples with a TiO2 layer with the thickness of this layer in the range 30-35Â nm.
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Authors
L. Skowronski, A.A. Wachowiak, K. Zdunek, M. Trzcinski, M.K. Naparty,