Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5488813 | Current Applied Physics | 2017 | 4 Pages |
Abstract
We report on ferroelectric properties of the monoclinic BiFeO3 thin films grown on (001) and (110) SrTiO3 substrates. Structural analysis using X-ray diffractometer and the electrical characterization of ferroelectricity reveal that the elastic constraint induced by the crystallographic orientation affects the remnant polarization values and retention properties of BiFeO3. The in-depth analysis based on the Williamson-Hall plot and thermodynamic analysis manifests that inhomogeneous strain related to the strain relaxation in the film is responsible for the change of the out-of-plane polarization and retention property of BiFeO3 thin films depending on the substrate orientation.
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Authors
B.C. Jeon, S.M. Yang, S.C. Chae,