Localization length fluctuation in randomly layered media

Localization properties of the two-component randomly layered media (RLM) are studied in detail both analytically and numerically. The localization length is found fluctuating around the analytical result obtained under the high-frequency limit. The fluctuation amplitude approaches zero with the increasing of disorder, which is characterized by the distribution width of random thickness. It is also found that the localization length over the mean thickness periodically varies with the distribution center of random thickness. For the multi-component RLM structure, the arrangement of material must be considered.