Topological and morphological analysis of gamma rays irradiated chitosan-poly (vinyl alcohol) blends using atomic force microscopy

In the present communication, binary blends of poly (vinyl alcohol) (PVA) and chitosan (CS) were prepared by solution cast method and the roughness parameters of PVA, native CS and CS-PVA blend films were determined using atomic force microscopy (AFM). Moreover, the changes in the morphology of the samples were also investigated after irradiation of gamma rays at absorbed dose of 1 Mrad and 10 Mrad for the scanning areas of 5×5 µm2, 10×10 µm2 and 20×20 µm2. Amplitude, statistical and spatial parameters, including line, 3D and 2D image profiles of the experimental surfaces were examined and compared to un-irradiated samples. For gamma irradiated CS-PVA blends the larger waviness over the surface was found as compared to un-irradiated CS-PVA blends but the values of average roughness for both the films were found almost same. The coefficient of skewness was positive for gamma irradiated CS-PVA blends which revealed the presence of more peaks than valleys on the blend surfaces.