| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 594820 | Colloids and Surfaces A: Physicochemical and Engineering Aspects | 2011 | 7 Pages |
Abstract
⺠Plate condenser mounted on an atomic force microscope. ⺠Measuring the electrostatic force on a glass microparticle in external electric field. ⺠Determination of the electrostatic force components. ⺠Rapid evaluation of microparticle electrostatic behavior.
Related Topics
Physical Sciences and Engineering
Chemical Engineering
Colloid and Surface Chemistry
Authors
Jin W. Kwek, Ivan U. Vakarelski, Wai K. Ng, Jerry Y.Y. Heng, Reginald B.H. Tan,