| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 609438 | Journal of Colloid and Interface Science | 2010 | 10 Pages |
Abstract
Accurate structural analysis of conductive organized molecular films for alkylammonium-M(dmit)2 are carried out by in-plane and out-of plane X-ray diffractions.
Related Topics
Physical Sciences and Engineering
Chemical Engineering
Colloid and Surface Chemistry
Authors
Yoko Tatewaki, Shuji Okada, Ryosuke Itagaki, Takayoshi Nakamura, Atsuhiro Fujimori,