Inferring wettability of heterogeneous surfaces by ToF-SIMS

Time-of-flight secondary ion mass spectrometry (ToF-SIMS) has been examined as a possible predictive tool for surface wettability. Heterogeneous surfaces were prepared with hydrophilic and hydrophobic regions of known surface coverage using self-assembled monolayers. The surface coverage of each component was then correlated with ToF-SIMS fragmentation of the hydrophobic and hydrophilic surface groups and static contact angle measurements. From these measurements, a clear relationship between the surface wettability and relative intensity of characteristic secondary ions was identified. Moreover, our results for planar surfaces can be extrapolated to predict the wettability of particulate samples for which direct contact angle measurements are not straightforward. The ability to infer particle wettability by ToF-SIMS is well suited to mineral characterization and in particular, the prediction of mineral flotation efficiencies.

Graphical abstractThe wettability of chemically heterogeneous particles and plates, such as this incomplete octadecylphosphonic acid monolayer on mica, can be inferred from time-of-flight secondary ion mass spectroscopy.Figure optionsDownload full-size imageDownload as PowerPoint slide