Article ID Journal Published Year Pages File Type
6540962 Computers and Electronics in Agriculture 2013 8 Pages PDF
Abstract
A novel noncontact dual laser triangulation measuring device based on the Scheimpflug principle to measure petal thickness is presented. The actual petal thickness is precisely calculated from the normal direction of the petal surface.
Related Topics
Physical Sciences and Engineering Computer Science Computer Science Applications
Preview
Development and evaluation of a petal thickness measuring device based on the dual laser triangulation method
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