Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
6541128 | Computers and Electronics in Agriculture | 2013 | 7 Pages |
Abstract
⺠Diuraphis noxia induced stress and cause economic loss to wheat production. ⺠Multispectral image data can be used to detect stress in wheat fields. ⺠Stress in wheat fields may be a mixture of several stress causing factors. ⺠Spatial pattern metrics from multispectral imagery can be used to quantify stress. ⺠A discriminant function analysis can be used to differentiate stress induced by D. noxia from other stress causing factors.
Keywords
Related Topics
Physical Sciences and Engineering
Computer Science
Computer Science Applications
Authors
Georges F. Backoulou, Norman C. Elliott, Kristopher L. Giles, Mahesh N. Rao,